NEXIV Wafer Inspection
NSI Microscopy Inspection Automation launch the New High-Resolution Nikon integrated Wafer Loading Nexiv accompanied with NSI Automatic Attribute Defect Detection software.
NSI Microscopy Inspection Automation launch the New High-Resolution Nikon integrated Wafer Loading Nexiv accompanied with NSI Automatic Attribute Defect Detection software.
Simple Operational procedure have a set of instructions to follow but because these instructions are carried out by a human these instructions have a variation either by manual input or part manual handling. Application Specific Microscopy standardizes simple operating procedures allowing the human element to confirm a validated procedure offering complete repeatability.
Automated Handling allows the operator position a part on the Analyser and then it takes over, moving and placing the part where it should be for complete part inspection. This is the true meaning a standardized process inspection.